High power sampling for real-time monitoringIndustrial Laser Focus Monitoring System (ILMS)

The United States represented by Haina OpticsDatarayTo provide users with high-quality laser analysis and diagnosis solutions, in some scientific research, design or production applications, two problems are inevitably encountered: small-sized beams and high power.

The focused laser profile analyzer is different from the spot analyzer that uses the knife edge principle or slit principleCMOSAs the main detection component, the spot analyzer can real-time collect the true state of the beam cross-section through the pixel multiplication factor in the software（PMF）It can achieve breakthroughs in the minimum beam measurement size of cameras, and different configuration schemes can better meet user needs.

Industrial laser monitoring system（ILMS）Will be re imagedLensPlate2Components and high-power polarization maintaining sampler（PPBS）Combined, throughWinCamD-LCMAs the final testing device,CMOSThe sensor enables the device to present the true value of the detected laser cross-section, and the high-power focused spot analyzer can amplify the beam waist to present it at infinity, while sampling a small portion of the beam energy,LensPlate2The combined magnification allows for full two-dimensional measurements of beam points as small as a few micrometers.

ILMS uses beam sampling and amplification optics to achieveWinCamD-LCMImaging profilometer monitors high-power fiber output or beam focusing.

It is worth noting that when using lasers of any power, appropriate laser safety protocols must be followed. Please refer toANSIZ136.1It is essential to understand the optical path length, including every reflection through the glass surface/Transmission state.PPBSThe sampler has three holes for releasing laser radiation,Residual 1、Residual 2andOutputMost of the power will be withdrawnResidual 1Face, expected power up to99%The beam power will leaveResidual 1，Residual 2The output may be lower than1%Or keep it at50%The specific output depends on the material, wavelength, and input polarization state. Be careful and assume that beam traps (or other energy absorbing components) will be very hot

Note:650-1050 nmThe damage threshold for coated lenses is1000 W/cmand5.0 J/cm²

Pixel multiplication factor（PMF）：

During the software usage of the high-power focused laser profile analyzer,Pixel Multiplication FactorIt must be set correctly so that the software can automatically adaptILMSMagnification factor. Pixel multiplication factor（PMF）It must be set to the reciprocal of the magnification factor, for example: model isILMS-5X-LCMof5Requirements for industrial laser monitoring systemPMFThe value is0.2（1/5）As shown in the following figure, all measured values are in accordance withPMFValue display, whenPMFWhen set correctly, there is no need to manually calculate the correction value.

Industrial Laser Focus Monitoring System（ILMS）Lens design:

Each lens in LensPlate2 is designed to provide optimal performance for beams approaching the axis at infinite conjugate ratios.For lasers, this means that the beam on one side of each lens should be collimated for optimal performance, as shown in the figure.LensPlate2Calibrated so that when the beam is incident onWinCamDWhen imaging sensors, the focal point of the output lens will be aligned withWinCamD

Imaging sensors overlap.

The output lens is collimated to meet the infinite conjugate ratio requirement for optimal optical performance.

Example of infinite conjugate ratioOff axis performanceProvided by Haina OpticsDatarayThe lens plate produced is typically designed for axial measurement using achromatic or non spherical lenses, covering most laser measurement applications. If better off-axis imaging is required for applications, an input objective lens for off-axis imaging correction is usually needed. This type of objective lens can be purchased from third parties and sold as an infinitely corrected microscope objective lens.